HORIBA Jobin Yvon is one of the world’s largest manufacturers of spectroscopic systems and metrology products. We provide complete solutions for nano-materials analysis, characterization and nanotech research. Nano researchers can now exploit the key tools of Raman, Fluorescence and Ellipsometry to probe the composition, chirality, band gap and thickness of the new generation of functional nanomaterials. Whether you’re working with single-wall carbon nanotubes (SWCNT), quantum dots, nanoparticles, nanocrystals, or bio-nano materials there is a Raman, Fluorescence or Ellipsometry system to take your nanotechnology research to a new level.
| Raman
Microscopy |
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The HORIBA Jobin Yvon range
of Raman spectrometers and microscopes offer
the highest level of performance. True confocality
provides the highest definition images, multi-wavelength
operation gives access to the broadest range
of samples and high resolution options probe
subtle phase and structural properties. |
- Nano-materials
- SWCNT, Boron Nitride, breathing mode, chirality,
purity
- Polymers
- homogeneity and phase
- SAM
and LB films - structure and composition
- True
confocality
- High
resolution
- Multi-wavelength
- Raman
and NIR PL
- Combined
micro Raman and FTIR
- Raman
at extreme conditions
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 Click
here for more information on the Automated Raman
Click
here for more information on the High Resolution
Raman
Click
here for more information on the High Performance
Raman
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Fluorescence |
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With the range
of spectrofluorimeters from HORIBA Jobin Yvon
you can explore an increasing number of materials
and applications. Versatile and high performance
equipment does not limit the scope and depth
of analysis. |
- Fluorescence
excitation
- PLE
- Steady-state
- Lifetime
- Micro-spectroscopy
- Quantum
yield
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- Bio-molecules
- Nanotube
dimensions
- Proteins
- Quantum
Dots
- Tags
and markers
- Low
temperature
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Click
here for more information on Fluorescence
Click
here for more information on the NanoLog |
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Ellipsometry |
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The MM-16 spectroscopic
ellipsometer enhances the capabilities of classical
ellipsometry for the characterization of thin
film thickness and optical properties. Exceptionally
high accuracy and simplicity provide fast and
robust sample analysis. This is only the starting
point for the MM-16! The instrument delivers
a complete solution for both standard and advanced
film and device characterization. |
- Thick
to ultra-thin films
- Multilayer
structures
- Biomedical
devices
- Display
structures
- Metal
films
- Bio-membranes
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- Films
with low index contrast
- Plastics
and polymers
- Optical
coatings
- Nanomaterials
- Liquid
crystal structures
- Solid/liquid
and liquid/liquid interface
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Click
here for more information on Ellipsometry
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Particle
Size Analysis
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HORIBA LB550 dynamic light
scattering range, is an answer to all your
nanomaterials particle size characterisation
from nm to micron scale. Emulsions or suspensions
can be analysed within a large range of concentration
without dilution. It’s unique built-in
viscometer probe guarantee a high degree of
accuracy requested in such field.
A large number of applications are covered
by this technique, such as:
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- Inks,
painting pigments
- Ceramics,
material sciences
- Cosmetics,
Pharmaceuticals
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- Bio
materials
- Polymers
- Food
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Click
here for more information on Particle Size
Analysis
Click
here for more information on the
LB-550
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