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Raman News
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in-situ Raman
Spectroscopy in the World's Oceans
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Raman Spectroscopy is no longer exclusively a laboratory analytical
technique. It has become a very promising way for chemical and
environmental monitoring in the undersea world.
Increasing concern over the natural environment has prompted regulatory
bodies to enforce continued monitoring of coastal areas and estuaries.
To meet this challenge, it has been necessary to develop marine
equipment to:
- Monitor accidents and spills
- Act as alarm sensors
- Support oceanographic studies
 Click
here to find out more.
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Sub Micron Analysis - Raman/AFM
Hybrid Raman Technology
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HORIBA Jobin Yvon the world leaders in Raman spectroscopy has announced
the launch of its new series of LabRAM Raman microscopes compatible
with AFM coupling and integration.
Click
here to find out more.
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Spectral Dimensions® and HORIBA
Jobin Yvon Inc
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Spectral Dimensions® and HORIBA Jobin Yvon Inc. proudly
announce the availability of Spectral Dimensions’ ISys® Software for use with HORIBA Jobin Yvon imaging
systems.
ISys has rapidly become the industry standard software product
for processing chemical images. The chief advantage of ISys is that it supports more robust assessment
of chemical image data.
Click here
to find out more.
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High performance Raman and FTIR just got easier
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HORIBA Jobin Yvon has announced the launch of its new series of combined Raman and FTIR Microscope systems. Following on from the award winning LabRAM IR, the new LabRAM IR2 and LabRAM ARAMIS IR2 systems provide an expanded range of micro-analysis facilities upon the single benchtop instrument.
Click here
to find out more.
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Raman Imaging: Defining the Spatial Resolution of the Technology
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Chemical images of polystyrene beads on silicon acquired using Raman
mapping and image processing are reviewed. The effects of the objective
on the quality of the final image, particularly its magnification
and numerical aperture, and the step size of the map, are discussed
as well.
Click
here to read this article.
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Spectroscopy Solutions for Materials
Analysis
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Raman and EDXRF Chemical Imaging for Formulation Process
Development and Quality Control Compounds of magnesium and calcium
are common components of pharmaceutical formulations.
Spectroscopic imaging can provide a complete understanding of a
formulation. This paper compares two spectral imaging techniques
— energy dispersive X-ray fluorescence (EDXRF) microscopy and Raman
microscopy.
Click
here to read this article.
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Uses of Raman Spectroscopy
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The use of Raman Spectroscopy in the Detection of Counterfeit and
Adulterated Pharmaceutical Products.
The counterfeiting of commercial products such as clothing items,
hand bags and movies is an ever-increasing worldwide problem. However,
the risk to the public health from purchasing a counterfeit hand bag is minimal compared to the risk associated
with a consumer purchasing and consuming a counterfeit pharmaceutical
product.
Click
here to read this article.
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Case Studies in the Application of Raman Microscopy
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The authors discuss how the Raman microscope is being used successfully
to characterize pharmaceuticals, analyze disease states, and to
characterize semiconductors and nanotechnologies.
Click
here to read this article.
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Elucidation of the atherosclerotic disease process
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Raman and FTIR microprobe spectroscopy have been used to charaterize
the atherosclerotic process in Apo E and wild type mice.
Click
here for further information.
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Vibrational Spectroscopy of Ultra-Low-k Dielectric Materials
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Tienta Sciences have appointed
Jobin Yvon Inc, as the exclusive distributor of SpectRIM™
Raman substrates designed to increase Raman sensitivity
when measuring material from low concentration solutions.
Applications include proteomics, forensics and HPLC.
more
information
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In Vivo Raman
Measurements of Human Skin
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A new application note detailing
the use of confocal Raman spectroscopy for in vivo diagnosis
of skin diseases and the improvement of transdermal drug
administration is available for download.
Download application
note
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Waters Symposium
Lecture - Pittcon 2003
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FRAN ADAR's presentation for the
Waters Symposium Lecture 'Evolution of Instrumentation for
Detection of the Raman Effect as Driven by Available Technologies
and by Developing Applications' is available for download
by clicking
here (1.3MB PDF).
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Stress Measurements
in Silicon Devices : All you ever wanted to know
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Ingrid De Wolf and researchers
at IMEC, Leuven, Belgium are renowned for their studies
of microelectronics by Raman and PL. This Month, Ingrid
publishes an in depth article detailing the technique and
the practical considerations of Raman stress measurements.
Click on the following link ‘Raman
spectroscopy: about chips and stress’ for the
full article from Spectroscopy Europe.
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Strained Si for
Sub-100 nm MOSFETs
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In a further article researchers
at IBM SRDC, Research Division and Microelectronics Division
announce the use of Raman in the study of ultra-thin strained
Si channel devices. Click on the following link for the
article abstract ‘Strained
Si for Sub-100 nm MOSFETs’.
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