Jobin Yvon offers the unique Raman PL bench top system. Using a combination of both visible and infrared spectroscopies, it yields greater depth of information than is possible by just a single range analysis.

This is particularly useful in the characterisation of semiconductor materials and can provide information directly related to the electronic and optical properties of the sample.

Emission spectra in photoluminescence measurements often extend across the Near IR, (above 1.1 microns), where conventional Raman instruments using CCD detectors are usually not sensitive. To achieve Raman and photoluminescence analysis, Jobin Yvon's LabRam system can now include two ports for different detectors, a standard Raman CCD detectors and an InGaAs Array detectors, the latter being ideally suited to the NIR PL (photoluminescence) range.

The user has the ability to switch between Raman and PL analysis without any need for adjustment, The instruments combine the two techniques and enables both measurements to be made at exactly the same position on the sample for precise characterisation and analysis.

	The screen shot shows Raman spectra and PL maps of a silicon wafer, derived from thermal donor characteristics.
PL excited at 532nm and detected in NIR range on InGaAs array detected option.