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 Fully Automated Ellipsometers for Semiconductor Industry


Automatic Spectroscopic and laser ellipsometer such as the UT-300 and PQ Ruby provide production line monitoring of film thickness measurements, optical constants and film composition. Advanced automation, standardization and robust data are delivered to suit the advanced requirements of semiconductor industry for volume production.

UT-300

UT-300
Automatic Spectroscopic Ellipsometer

PQ Ruby

PQ Ruby-LE
Automatic Laser Ellipsometer / Reflectometer

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