Great
Success for the 3rd Meeting of the HORIBA Jobin
Yvon Ellipsometer User Club
The annual meeting for the French speaking users of HORIBA
Jobin Yvon ellipsometers was held on 18th January
2007.
The day was appreciated by our users allowing us to keep them
informed of the continuous improvement of our ellipsometers
and DeltaPsi2 software. It also provided the opportunity to
listen carefully to their needs and develop relationships with
them. It also devoted a significant part to the technique and
the practice on various applications, each one benefitting
from the experience of each other! This 3rd meeting
was particularly based on the topic of workshops organized
for the afternoon.
Three workshops were held in parallel:
For the third consecutive year, this meeting was a success which
included an increase in the number of participants. We hope that
2007 brings even richer collaborations.
For
additional information please contact: tfd-sales@jobinyvon.fr
Continuing Technical Seminar in
Spectroscopic Ellipsometry
A technical seminar in spectroscopic ellipsometry was held in
the University of Brno (Czech Republic), the HORIBA Jobin Yvon’s
centre of excellence in ellipsometry on the 24th and 25th October.
The conference was conducted over two days:
-
the
1st day provided the opportunity to gain a better understanding
of the spectroscopic ellipsometry technique and its applications.
In addition, participants presented very diverse, and interesting
applications related to in-situ ellipsometry of DLC films,
ellipsometric studies of membrane formation and protein-membrane
interactions, optical measurements of Si wafer temperature,
and modeling of optical constants of solids.
-
A
sample analysis session was organized the 2nd day. Attendees
brought samples that were analyzed using the UVISEL and MM-16
spectroscopic ellipsometers. Hands-on demonstrations are
always very appreciated as it allows users to see how the
analysis is performed, the possibilities of the technique
and give some results of the sample under analysis!
The number of participants and their high level of interest
proved that Spectroscopic Ellipsometry is becoming more and more
popular to characterize thin film thickness and optical constants
simply, accurately and non destructively.
We would like to thank the very good support provided by the
University of Brno and the Labimex company, and the HORIBA Jobin
Yvon representative in the Czech Republic.
Successful Technical Seminar in Spectroscopic
Ellipsometry organized by HORIBA Jobin Yvon
A
technical seminar in spectroscopic ellipsometry was held
near Grenoble in a beautiful place called Uriage les bains
on the 8th June 2006. Calm surroundings, in the heart of
the country, on a plateau overlooking the valley and the
resort, it was ideal conditions to introduce the equations
of ellipsometry in a peaceful atmosphere.
The choice of the site was particularly related to the
presence of a pole of research and very dynamic industrialization
on micro and nano technologies, and a true need for solutions
for the characterization of thin films and complex structures.
Ramdane Benferhat, the Thin Film Division director, opened
the day with a general introduction of spectroscopic ellipsometry.
He highlighted the evolutions of the technique towards
polarimetry. After lunch Mélanie Gaillet presented
an overview of application capabilities of spectroscopic
ellipsometry covering the fields of semiconductors, optical
coatings, display, data storage, telecommunications, bio
and nanotechnologies. The seminar finished with a hands-on
demonstration of the MM-16 spectroscopic ellipsometer.
Attendees brought samples that were modeled by Céline
Eypert. The samples were very diverse, diamond like carbon,
thin metal films, oxinitrides, etc…This practical
session was very appreciated by all the attendees and caused
technical discussions around the varied applications of
the participants and the possibilities of the technique.
Attendance exceeded all expectations and proved extremely
popular with both established and new customers, working
mainly in the field of the semiconductors, nano and biotechnologies.
For additional information please contact: 
The
DIGILEM camera family has been released by HORIBA Jobin
Yvon with the new versatile LEM camera series offering a
compact design and enhanced image quality for all types
of samples.
MM-16
Spectroscopic Ellipsometer
UVISEL
VIP
