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 ULTIMA 2 - Productivity & Performance Defined


  • ULTIMA 2Single view radial provides lowest detection limits of any ICP OES spectrometer available today.
  • Continuous wavelength coverage from 160 - 800nm standard with optional extension down to 120nm for Far UV analysis of the halogen elements or the use of alternate wavelengths.
  • Unmatched spectral resolution of 5 pm at <320 nm minimizes interferences, with optional grating to further improve resolution for line rich matrices such as geological or precious metals.
  • Fast, accurate analysis with Rapid Chip electronics and powerful Analyst™ software.
  • Patented HDD® detection provides analysis of sub-ppb to percent level in one analysis.
  • Dynamic range of up to 10 orders of magnitude using Win-IMAGE.
  • Quick-release torch is fully demountable and needs no alignment.
  • Unique sheath gas feature, allows continuous analysis of 30% dissolved solids.
 
 
 
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